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212 pages • missing pub info (editions)
ISBN/UID: 9781461364290
Format: Paperback
Language: English
Publisher: Springer
Publication date: 27 September 2012
Description
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level...
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Content Warnings
212 pages • missing pub info (editions)
ISBN/UID: 9781461364290
Format: Paperback
Language: English
Publisher: Springer
Publication date: 27 September 2012
Description
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level...
Community Reviews
Content Warnings